Advances in X-Ray Analysis: Volume 39 by J. L. de Vries (auth.), John V. Gilfrich, Ron Jenkins,

By J. L. de Vries (auth.), John V. Gilfrich, Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith, Paul K. Predecki (eds.)

Historical stories of X-Ray technology and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry; J.L. de Vries.Conditoningof X-Ray Beams and different advancements in X-Ray Instrumentation: software of Graded Multilayer Optics in X-Ray Diffraction; M.Schuster, H. Gobel.Stress and pressure decision by way of DiffractionMethods, height Broadening Analysis: real initiatives of tension research by way of Diffraction; V. Hauk.Characterization of Polymers, AmorphousMaterials and Organics by means of X-Ray Neutron Scattering: research of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers; N.S. Murthy.Precision, Accuracy in XRD, section Analysis: result of X-Ray Powder Diffraction around Robin checks with Corundum Plates and Powder Samples; V. Valvoda, et al.Characterization of skinny motion pictures byX-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in skinny motion pictures; I.C. Noyan, C.C. Goldsmith.Other functions of X-RayDiffractions together with High-Temperature and Nonambient: TotalReflection XRF and hint research: Quantitative ZRF DataInterpretation and different XRF Applications. ninety five extra Articles. Index.

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I have been privileged to observe, and indeed, to be intimately involved with, the development of these automated instruments, both in hardware control and data processing. In retrospect, it seems to me that we generally did a better job of controlling the hardware than we did of treating the data, especially in the case of X-ray fluorescence. I guess this is because we were lucky to have electronic and mechanical engineers who knew not just what they were doing, but also just what they were supposed to be doing.

1968), "Calculation methods far tluorescent X-ray spectrometry - empirical coefficients \IS. Fundemental parameters", Anal. K. (1973), "X-ray tluorescence analysis applying theoretical matrix corrections. Stainless steel". , 2,151-158 [12] Rex, R W. (1966), ''Numerical contral X-ray powder diffi'actometer", Adv. J. Jr. and Vand,V. (1967), "A computerized powder ditTraction identification system", Ind. Eng. C. , 7, 57-62 [17] Jenkins, R(1994), "Impact ofthe personal computer on X-ray analysis, Historical perpective 19601990, Adv.

Until reccntly, Most of the commercial mainframc and PC bascd software packages for qua1itative phase identification have been designcd to implement a fully automatie searchlmatching sequence. All of the major instrument suppliers now offer such programs as part of thcir Automatcd Powder Dimactometcr (APO) packagcs. Whilc thcse programs are cxtremcly useful, thc success of their application to a specifie problem is critically depcndcnt on the quality of both cxperimcntaI data and reference data.

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